Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1999 Vol. 158; Iss. 1-4
Channeling contrast microscopy of GaN and InGaN thin films
T Osipowicz, S.Y Chiam, F Watt, G Li, S.J ChuaVolume:
158
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0168-583x(99)00336-5
File:
PDF, 269 KB
english, 1999