Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1999 Vol. 158; Iss. 1-4
Evaluation of the diffusion length in silicon diodes by means of the lateral IBIC technique
E Vittone, F Fizzotti, E Gargioni, R Lu, P Polesello, A LoGiudice, C Manfredotti, S Galassini, M JaksicVolume:
158
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0168-583x(99)00383-3
File:
PDF, 199 KB
english, 1999