Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1999 Vol. 158; Iss. 1-4
A method for constructing multi-layered thickness profiles from micro-PIXE line-scans
J Nickel, A.N ShuaibVolume:
158
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0168-583x(99)00530-3
File:
PDF, 490 KB
english, 1999