In situ surface analysis by low energy ion scattering

In situ surface analysis by low energy ion scattering

A.W Denier van der Gon, R Cortenraad, W.P.A Jansen, M.A Reijme, H.H Brongersma
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Volume:
161-163
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0168-583x(99)00673-4
File:
PDF, 217 KB
english, 2000
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