Study on extended gate field effect transistor with tin...

Materials Chemistry and Physics 2000 Vol. 63; Iss. 1

Study on extended gate field effect transistor with tin oxide sensing membrane

Li-Lun Chi, Jung-Chuan Chou, Wen-Yaw Chung, Tai-Ping Sun, Shen-Kan Hsiung
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Volume:
63
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0254-0584(99)00184-4
File:
PDF, 182 KB
english, 2000
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