Investigation of organic coatings and coating defects with the help of time-of-flight-secondary ion mass spectrometry (TOF-SIMS)
M Brenda, R Döring, U SchernauVolume:
35
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0300-9440(99)00035-1
File:
PDF, 174 KB
english, 1999