Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
J. Ben Youssef, K. Bouziane, O. Koshkina, H. Le Gall, M. El Harfaoui, M. El Yamani, J.M. Desvignes, A. FertVolume:
165
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0304-8853(96)00531-8
File:
PDF, 253 KB
english, 1997