A study of recorded bit patterns using TEM and MFM

S.M Casey, E.W Hill, J.J Miles, P Sivasamy, J.K Birtwistle, B.K Middleton, J Rose, J.N Chapman

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Volume:

193

Year:

1999

Language:

english

Pages:

DOI:

10.1016/s0304-8853(98)00477-6

File:

PDF, 598 KB

english, 1999

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