Anisotropy in metallic thin films patterned by the atomic saw method
H Jaffrès, L Ressier, F Michelini, D Chandesris, P Le Fèvre, H Magnan, J.L Gauffier, R Mamy, M Goiran, J.P Peyrade, J.F Bobo, J.C Ousset, J.P Redoulès, D Bertrand, A.R FertVolume:
203
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0304-8853(99)00212-7
File:
PDF, 179 KB
english, 1999