Control of complex manufacturing processes: a comparison of SPC methods with a radial basis function neural network
David A. West, Paul M. Mangiameli, Shaw K. ChenVolume:
27
Year:
1999
Language:
english
Pages:
14
DOI:
10.1016/s0305-0483(98)00053-x
File:
PDF, 201 KB
english, 1999