A depth profile fitting model for a commercial total...

Spectrochimica Acta Part B: Atomic Spectroscopy 1997 Vol. 52; Iss. 7

A depth profile fitting model for a commercial total reflection X-ray fluorescence spectrometer

Yoshihiro Mori, Kenichi Uemura, Kengo Shimanoe
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Volume:
52
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0584-8547(96)01665-5
File:
PDF, 503 KB
english, 1997
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