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Extended fine structure in characteristic X-ray fluorescence: A novel structural analysis method of condensed systems
Kouichi Hayashi, Jun Kawai, Yasuhiro AwakuraVolume:
52
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0584-8547(97)00097-9
File:
PDF, 387 KB
english, 1997