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An elliptical crystal spectrometer suitable for EXAFS studies of laser compressed materials and for high resolution x-ray spectroscopy
A. Ridgeley, D. Goodman, T.A. HallVolume:
5
Year:
1995
Language:
english
Pages:
17
DOI:
10.1016/s0895-3996(05)80015-1
File:
PDF, 768 KB
english, 1995