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Comparison of two models for pattern generation based on synaptic depression
Joël Tabak, Walter Senn, Michael J. O'Donovan, John RinzelVolume:
26-27
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0925-2312(99)00032-6
File:
PDF, 167 KB
english, 1999