Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2...

Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

Y.W Ho, V Ng, W.K Choi, S.P Ng, T Osipowicz, H.L Seng, W.W Tjui, K Li
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
44
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s1359-6462(01)00743-6
File:
PDF, 239 KB
english, 2001
Conversion to is in progress
Conversion to is failed