Examination of fracture surfaces using focused ion beam...

Examination of fracture surfaces using focused ion beam milling

J.M Cairney, P.R Munroe, J.H Schneibel
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Volume:
42
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s1359-6462(99)00374-7
File:
PDF, 758 KB
english, 2000
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