![](/img/cover-not-exists.png)
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs
Manic, I., Djoric-Veljkovic, S., Davidovic, V., Dankovic, D., Golubovic, S., Stojadinovic, N.Volume:
2
Year:
2008
Language:
english
DOI:
10.1049/iet-cds:20070173
File:
PDF, 538 KB
english, 2008