Parameter reduction for variability analysis by slice...

IET Circuits Devices & Systems 2008 Vol. 2; Iss. 1

Parameter reduction for variability analysis by slice inverse regression method

Mitev, A., Marefat, M., Ma, D., Wang, J.M.
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Volume:
2
Year:
2008
Language:
english
DOI:
10.1049/iet-cds:20070185
File:
PDF, 244 KB
english, 2008
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