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Scalable model for predicting the effect of negative bias temperature instability for reliable design
Bhardwaj, S., Wang, W., Vattikonda, R., Cao, Y., Vrudhula, S.Volume:
2
Year:
2008
Language:
english
DOI:
10.1049/iet-cds:20070225
File:
PDF, 551 KB
english, 2008