Test of data retention faults in CMOS SRAMs using special...

IEE Proceedings - Circuits Devices and Systems 2004 Vol. 151; Iss. 2

Test of data retention faults in CMOS SRAMs using special DFT circuitries

Champac, V.H., Avendano, V.
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Volume:
151
Year:
2004
Language:
english
DOI:
10.1049/ip-cds:20040431
File:
PDF, 1.39 MB
english, 2004
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