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Overview of the impact of downscaling technology on 1/f noise in p-MOSFETs to 90 nm
Valenza, M., Hoffmann, A., Sodini, D., Laigle, A., Martinez, F., Rigaud, D.Volume:
151
Year:
2004
Language:
english
DOI:
10.1049/ip-cds:20040459
File:
PDF, 1.44 MB
english, 2004