Comparison of low-frequency noise in III-V and Si/SiGe HBTs
Pascal, F., Chay, C., Deen, M.J., G-Jarrix, S., Delseny, C., Penarier, A.Volume:
151
Year:
2004
Language:
english
DOI:
10.1049/ip-cds:20040505
File:
PDF, 1.54 MB
english, 2004