Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits
Dudley, R.A., Roddie, A.G., Bannister, D.J., Gifford, A.D., Krems, T., Facon, P.Volume:
146
Year:
1999
Language:
english
DOI:
10.1049/ip-smt:19990171
File:
PDF, 753 KB
english, 1999