Ray analysis of electromagnetic field build-up and quality...

IEEE Transactions on Electromagnetic Compatibility 1998 Vol. 40; Iss. 1

Ray analysis of electromagnetic field build-up and quality factor of electrically large shielded enclosures

Do-Hoon Kwon, Burkholder, R.J., Pathak, P.H.
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Volume:
40
Year:
1998
Language:
english
Pages:
8
DOI:
10.1109/15.659516
File:
PDF, 225 KB
english, 1998
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