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ESD failure modes: characteristics mechanisms, and process influences
Amerasekera, A., van den Abeelen, W., van Roozendaal, L., Hannemann, M., Schofield, P.Volume:
39
Year:
1992
Language:
english
Pages:
7
DOI:
10.1109/16.121703
File:
PDF, 1.06 MB
english, 1992