Novel degradation effects in dynamically stressed p-channel...

Novel degradation effects in dynamically stressed p-channel MOSFETs

Bergonzoni, C., Libera, G.D., Nannini, A.
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Volume:
39
Year:
1992
Language:
english
Pages:
6
DOI:
10.1109/16.129095
File:
PDF, 551 KB
english, 1992
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