MOSFET drain engineering analysis for deep-submicrometer dimensions: a new structural approach
Shin, H., Tasch, A.F., Jr., Bordelon, T.J., Maziar, C.M.Volume:
39
Year:
1992
Language:
english
Pages:
6
DOI:
10.1109/16.144685
File:
PDF, 734 KB
english, 1992