Hot-electron degradation of n-channel polysilicon MOSFETs

Hot-electron degradation of n-channel polysilicon MOSFETs

Banerjee, S., Sundaresan, R., Shichijo, H., Malhi, S.
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Volume:
35
Year:
1988
Language:
english
Pages:
6
DOI:
10.1109/16.2434
File:
PDF, 553 KB
english, 1988
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