![](/img/cover-not-exists.png)
Hot-carrier degradation of submicrometer p-MOSFETs with thermal/LPCVD composite oxide
Lee, Y.-H., Yau, L.D., Hansen, E., Chau, R., Sabi, B., Hossaini, S., Asakawa, B.Volume:
40
Year:
1993
Language:
english
Pages:
6
DOI:
10.1109/16.249440
File:
PDF, 594 KB
english, 1993