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Modeling of CrSi2-Si and MoSi2-Si Schottky barrier contacts
Donoval, D., Snowden, C.M., Nagl, V., Racko, J., Barus, M.Volume:
42
Year:
1995
Language:
english
Pages:
3
DOI:
10.1109/16.387256
File:
PDF, 274 KB
english, 1995