Back and front interface related generation-recombination noise in buried-channel SOI pMOSFETs
Lukyanchikova, N., Petrichuk, M., Garbar, N., Simoen, E., Claeys, C.Volume:
43
Year:
1996
Language:
english
Pages:
7
DOI:
10.1109/16.485655
File:
PDF, 664 KB
english, 1996