An experimental and numerical study on the forward biased...

IEEE Transactions on Electron Devices 1996 Vol. 43; Iss. 3

An experimental and numerical study on the forward biased SOA of IGBTs

Hagino, H., Yamashita, J., Uenishi, A., Haruguchi, H.
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Volume:
43
Year:
1996
Language:
english
Pages:
11
DOI:
10.1109/16.485667
File:
PDF, 1.24 MB
english, 1996
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