An improved technique and experimental results for the extraction of electron and hole mobilities in MOS accumulation layers
Chindalore, G.L., McKeon, J.B., Mudanai, S., Hareland, S.A., Shih, W.-K., Wang, C., Tasch, A.F., Jr., Maziar, C.M.Volume:
45
Year:
1998
Language:
english
Pages:
10
DOI:
10.1109/16.658687
File:
PDF, 274 KB
english, 1998