A new write/erase method to improve the read disturb...

A new write/erase method to improve the read disturb characteristics based on the decay phenomena of stress leakage current for flash memories

Endoh, T., Shimizu, K., Iizuka, H., Masuoka, F.
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Volume:
45
Year:
1998
Language:
english
Pages:
7
DOI:
10.1109/16.658817
File:
PDF, 128 KB
english, 1998
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