A new write/erase method to improve the read disturb characteristics based on the decay phenomena of stress leakage current for flash memories
Endoh, T., Shimizu, K., Iizuka, H., Masuoka, F.Volume:
45
Year:
1998
Language:
english
Pages:
7
DOI:
10.1109/16.658817
File:
PDF, 128 KB
english, 1998