Rapid thermal postoxidation anneal engineering in thin gate...

Rapid thermal postoxidation anneal engineering in thin gate oxides with Al gates

Chin-Yang Chen, Ming-Jer Jeng, Jenn-Gwo Hwu
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Volume:
45
Year:
1998
Language:
english
Pages:
7
DOI:
10.1109/16.658838
File:
PDF, 172 KB
english, 1998
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