Matching analysis of deposition defined 50-nm MOSFET's

Matching analysis of deposition defined 50-nm MOSFET's

Horstmann, J.T., Hilleringmann, U., Goser, K.F.
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Volume:
45
Year:
1998
Language:
english
Pages:
8
DOI:
10.1109/16.658845
File:
PDF, 223 KB
english, 1998
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