Full-band Monte Carlo investigation of hot carrier trends...

Full-band Monte Carlo investigation of hot carrier trends in the scaling of metal-oxide-semiconductor field-effect transistors

Duncan, A., Ravaioli, U., Jakumeit, J.
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Volume:
45
Year:
1998
Language:
english
Pages:
10
DOI:
10.1109/16.662792
File:
PDF, 169 KB
english, 1998
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