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Breakdown behavior of low-power pseudomorphic AlGaAs/InGaAs 2-D MESFET's
Hurt, M.J., Meneghesso, G., Zanoni, E., Peatman, W.C.B., Tsai, R., Shur, M.S.Volume:
45
Year:
1998
Language:
english
Pages:
3
DOI:
10.1109/16.704387
File:
PDF, 96 KB
english, 1998