A new aspect of mechanical stress effects in scaled MOS...

A new aspect of mechanical stress effects in scaled MOS devices

Hamada, A., Furusawa, T., Saito, N., Takeda, E.
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Volume:
38
Year:
1991
Language:
english
Pages:
6
DOI:
10.1109/16.75220
File:
PDF, 592 KB
english, 1991
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