Noise parameter optimization of UHV/CVD SiGe HBT's for RF...

IEEE Transactions on Electron Devices 1999 Vol. 46; Iss. 8

Noise parameter optimization of UHV/CVD SiGe HBT's for RF and microwave applications

Guofu Niu, Ansley, W.E., Shiming Zhang, Cressler, J.D., Webster, C.S., Groves, R.A.
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Volume:
46
Year:
1999
Language:
english
Pages:
10
DOI:
10.1109/16.777145
File:
PDF, 348 KB
english, 1999
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