Determination of the excess carrier lifetime in the...

IEEE Transactions on Electron Devices 1999 Vol. 46; Iss. 8

Determination of the excess carrier lifetime in the collector region of silicon power bipolar transistors

Yu Wu, Sin, K.O., Bao-Wei Kang, Zhi-Tao Guo, Xu Cheng
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Volume:
46
Year:
1999
Language:
english
Pages:
6
DOI:
10.1109/16.777170
File:
PDF, 245 KB
english, 1999
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