A new on-chip interconnect crosstalk model and experimental...

IEEE Transactions on Electron Devices 2000 Vol. 47; Iss. 1

A new on-chip interconnect crosstalk model and experimental verification for CMOS VLSI circuit design

Yungseon Eo, Eisenstadt, W.R., Ju Young Jeong, Oh-Kyong Kwon
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Volume:
47
Year:
2000
Language:
english
Pages:
12
DOI:
10.1109/16.817578
File:
PDF, 285 KB
english, 2000
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