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Relation between low-frequency noise and long-term reliability of single AlGaAs/GaAs power HBTs
Mohammadi, S., Pavlidis, D., Bayraktaroglu, B.Volume:
47
Year:
2000
Language:
english
Pages:
10
DOI:
10.1109/16.830979
File:
PDF, 215 KB
english, 2000