Sensitivity of CMOS based imagers and scaling perspectives
Lule, T., Benthien, S., Keller, H., Mutze, F., Rieve, P., Seibel, K., Sommer, M., Bohm, M.Volume:
47
Year:
2000
Language:
english
Pages:
13
DOI:
10.1109/16.877173
File:
PDF, 249 KB
english, 2000