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An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs
Jung-Suk Goo, Chang-Hoon Choi, Danneville, F., Morifuji, E., Momose, H.S., Zhiping Yu, Iwai, H., Lee, T.H., Dutton, R.W.Volume:
47
Year:
2000
Language:
english
Pages:
10
DOI:
10.1109/16.887030
File:
PDF, 193 KB
english, 2000