Semiclassical and wave mechanical modeling of charge control and direct tunneling leakage in MOS and H-MOS devices with ultra-thin oxides
Cassan, E., Dollfus, P., Galdin, S., Hesto, P.Volume:
48
Year:
2001
Language:
english
Pages:
7
DOI:
10.1109/16.915702
File:
PDF, 153 KB
english, 2001