A trap generation closed-form statistical model for...

IEEE Transactions on Electron Devices 2001 Vol. 48; Iss. 6

A trap generation closed-form statistical model for intrinsic oxide breakdown

Huan-Tsung Huang, Ming-Jer Chen, Chi-Wen Su, Jyh-Huei Chen, Chin-Shan Hou, Mong-Song Liang
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Volume:
48
Year:
2001
Language:
english
Pages:
3
DOI:
10.1109/16.925260
File:
PDF, 122 KB
english, 2001
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