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Theoretical study of RF-breakdown in bulk GaN and GaN MESFETs
Farahmand, M., Brennan, K.F., Gebara, E., Deukhyoun Heo, Young Suh, Laskar, J.Volume:
48
Year:
2001
Language:
english
Pages:
6
DOI:
10.1109/16.944168
File:
PDF, 90 KB
english, 2001