A study of the threshold voltage variation for ultra-small...

IEEE Transactions on Electron Devices 2001 Vol. 48; Iss. 9

A study of the threshold voltage variation for ultra-small bulk and SOI CMOS

Takeuchi, K., Koh, R., Mogami, T.
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Volume:
48
Year:
2001
Language:
english
Pages:
7
DOI:
10.1109/16.944188
File:
PDF, 170 KB
english, 2001
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