Theoretical analysis and experimental characterization of...

IEEE Transactions on Electron Devices 2001 Vol. 48; Iss. 9

Theoretical analysis and experimental characterization of the dummy-gated VDMOSFET

Shuming Xu, Changhong Ren, Liang, Y.C., Pan-Dow Foo, Sin, J.K.O.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Year:
2001
Language:
english
Pages:
9
DOI:
10.1109/16.944212
File:
PDF, 260 KB
english, 2001
Conversion to is in progress
Conversion to is failed